Estudo de degradação de filmes finos de haletos de perovskitas orgânico-inorgânicos sobre diferentes substratos

Abstract

In this work, perovskite thin films of organic-inorganic multication lead halides (HOIP) were studied in order to understand how the degradation process affects the optoelectro nic properties of the films on different substrates. To characterize the films, traditional spectroscopy techniques were used to characterize materials with optical properties, such as UV-Vis absorption and Photoluminescence (PL), and the X-Ray Diffraction (XRD) technique was used to characterize the structures of the films . The use of these tech niques has allowed a systematic investigation of the optical properties of films and the monitoring of how they change as the material degrades due to exposure to heat and humidity. For studies of the degradation process, the degradation protocol was carried out over a period of 30 days, in which day 1 was the specific day in which the films were synthesized and during the first 5 days the optical characterization measurements were taken, a once a day at the same time, and in the remaining 30 days, optical measurements were taken again on days 10, 20 and 30. As for the structural characterization measure, a second batch of films was synthesized, in which measurements were taken on days 1, 5, 10, 20 and 30. It was possible to observe the degradation of the perovskite films over the days to be measured by XRD and to compare the XRD results with the UV-vis and PL results to verify how the optical properties were altered due to the degradation process of the films.